Outstanding conference contributions from Merve Kabukcuoglu and Mathias Hurst

Merve Kabukcuoglu and Mathias Hurst, along with the IPS laminography group, have recently been recognized for their exceptional contributions at major conferences.

Mathias Hurst received a poster award at the 16th Conference on X-ray Microscopy in Lund, Sweden. He presented the development of in situ multiscale X-ray computed laminography and its application to the study of damage formation inside alloy sheets, under shear loading and load path changes. Damage formation and the underlying mechanisms under such loading scenarios have not been understood up to now, but are highly relevant for applications, e.g., in the transportation sector. Thanks to methodological advances, the 3D imaging technique now allows hierarchical and correlative investigations of materials from the micro- to the nanoscale, enabling the quantitative study of damage nucleation and growth in aluminium alloy sheets.

Merve Kabukcuoglu received the IUCr Young and Early Career Scientist Award at the XTOP 2024 conference in Carry-le-Rouet, France. She discussed evolution of dislocation arrangements and slip bands in GaAs wafers under the impact of thermal gradients and crystal polarity by using X-ray diffraction imaging techniques. By utilizing the 3D X-ray diffraction laminography, features of multiplication and interaction of individual dislocations within the crystal bulk are investigated, allowing to propose a general model for slip band formation in such semiconductor wafers.